Wafer Metrology Centre– an upgradeable solution for the challenging task of minute measurement in chip manufacturing

13 Oct 2020

The co-labeled EURIPIDES² and PENTA Wafer Metrology Centre (WMC) project led by an SME, aims to provide manufacturers with new and more flexible tools to check the miniscule features on electronic chips during the production process. Designed for measurements during quality control, the integrated WMC hardware and software platform will be easily able to evolve as new applications, designs and demands on performance continue to grow.

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